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Examination of the atomic pair distribution function (PDF) of SiC
nanocrystals by in-situ high pressure diffraction
E. Grzanka
,
, a,
b,
S. Stel’makha,
S. Gierlotkaa,
Y. Zhaoc,
B. Palosza
and W. Paloszd
a High Pressure Research Center
UNIPRESS, ul. Sokolowska 29/37, 01-142, Warsaw, Poland
b Institute of Experimental Physics, Warsaw University,
ul. Hoza 69, 00-681, Warsaw, Poland
c Los Alamos
National Laboratory, Los Alamos, NM 87545, USA
d
BAE SYSTEMS /NASA-Marshall Space Flight Center, Huntsville, AL 35812, USA
Received 24 October 2003; Revised 5 April 2004; accepted 15
April 2004. Available online 30 July 2004.
X-ray and neutron diffraction experiments were performed on nanocrystalline SiC with the average grain diameters of 7, 12, and 16 nm subjected to isostatic pressure. Under pressure the interatomic distances undergo a complex, non-monotonic changes which were correlated with the compression of the SiC lattice determined from the Bragg scattering. The results indicate the presence of non-uniform distribution of stresses between the interior and surface shell of the nanograins. The present results lend a strong support to the concept of a core-shell model of nanocrystals.
Author Keywords: Nanocrystals; Silicon carbide; Diffraction;
High pressure
(10K)
(15K)
(7K)
(6K)1. B. Palosz, E. Grzanka, S. Gierlotka, S. Stel’makh, R. Pielaszek, U. Bismayer, J. Neuefeind, H.-P. Weber and W. Palosz. Acta Phys. Pol. A 102 (2002), p. 57. Abstract-INSPEC
2. B. Palosz, E. Grzanka, S. Gierlotka, S. Stel’makh, R. Pielaszek, U. Bismayer, J. Neuefeind, H.-P. Weber, Th. Proffen, R. von Dreele and W. Palosz. Z. Kristallogr. 217 (2002), p. 497. Full Text via CrossRef
3. B. Palosz, E. Grzanka, S. Gierlotka, S. Stel’makh, R. Pielaszek, U. Bismayer, H.-P. Weber, Th. Proffen and W. Palosz. Solid State Phenom. 94 (2003), p. 203. Abstract-Compendex | Abstract-INSPEC
4. B. Palosz, S. Gierlotka, S. Stel’makh, R. Pielaszek, P. Zinn and U. Bismayer. J. Alloys Compd. 286 (1999), p. 184. SummaryPlus | Full Text + Links | PDF (772 K)
5. B. Palosz, S. Stel’makh, E. Grzanka, S. Gierlotka, R. Pielaszek, U. Bismayer, S. Werner, W. Palosz, J. Phys. Condens. Matter 15 (2003) 1.
6. H.-P. Martin, E. Muller, R. Richter, G. Roever and E. Brenler. J. Mater. Sci. 32 (1997), p. 381.
7. J.W. Otto. Nucl. Instrum.: Phys. Res. A 384 (1997), p. 552. SummaryPlus | Full Text + Links | PDF (662 K)
8. U. Ponkratz, R. Nicula, A. Jianu and E. Burkel. J. Phys.: Condens. Matter 12 (2000), p. 8071. Abstract-Compendex | Abstract-INSPEC | Full Text via CrossRef
9. P. Peterson, M. Gutmann, Th. Proffen and S.J.L. Billinge. J. Appl. Cryst. 33 (2000), p. 1192. Full Text via CrossRef
10. R. Pielaszek, Diffraction Studies on Microstructure of Nanocrystals Under External Stresses, Ph. D. Thesis, 2002, Warsaw University, Warsaw, Poland.
11. U. Buontempo, A. Filipponi, D. Martinez-Garcia, P.
Postorino, M. Mezour and J.P. Itie. Phys. Rev. Lett. 80
9 (1998), p. 1912. Abstract-INSPEC
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Volume 382, Issues 1-2 , 17 November 2004, Pages 133-137 Proceedings of the European Materials Research Society Fall Meeting, Symposium B | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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