Fast time-resolved x-ray diffraction in BaTiO3 films subjected to a strong high-frequency electric field
E. Zolotoyabko*, J. P. Quintana**, B. H. Hoerman*** and B. W. Wessels***
Appl. Phys. Letts. 80(17) 3159 (2002).
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Abstract:
The pulsed synchrotron radiation from the Advanced Photon Source
of Argonne National Laboratory was used to measure the dynamic
structural response in 200-nm-thick BaTiO 3 ferroelectric films,
in situ, under the application of a high-frequency electric
field. X-ray diffraction measurements were performed in the
stroboscopic mode, i.e., by synchronizing the x-ray bursts with
the electric-field periodicity. Time-dependent variations of
lattice parameters were derived from the electric-field-induced
distortions of the diffraction profiles. Drastic reduction of the
relaxation time, from 6.9 ns at 71.69 MHz down to 0.7 ns at
521.36 MHz, was found with an increase of the electric-field
frequency. © 2002 American Institute of Physics.
Addresses:
* Department of Materials Engineering, Technion–Israel
Institute of Technology, Haifa 32000, Israel
** DND–CAT Research Center, Northwestern University, APS/ANL
Sector 5, Building 432A, 9700 South Cass Avenue, Argonne,
Illinois 60439-4857
*** Department of Materials Science and Engineering, Northwestern
University, Evanston, Illinois 60208