Dynamic response of the dielectric and electro-optic properties of epitaxial ferroelectric thin films
B.H. Hoerman, B.M.Nichols, B.W.Wessels
Phys. Rev. B. vol. 65 p. 224110 (2002).
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Abstract:
An analysis of the dynamic dielectric and electro-optic relaxation response of thin-film ferroelectrics is presented. The analysis is based upon the relaxation of ferroelectric domains with a continuous distribution of sizes given by percolation theory. The resulting temporal response is described by the expression F(t) ~ t^-m * exp{-( t / tau)^beta}. The analysis was applied to KNbO3 thin films. Measurements of the polarization, birefringence and dielectric transients show qualitative agreement with the model over 11 orders of magnitude in time.